Section outline

  • General description of the capabilities of the Renishaw inVia confocal Raman microscope can be found here.


    Renishaw inVia Reflex Spectrometer System for Raman StreamLineTM spectral analysis and rapid imaging system.  

    Available laser wavelengths:  325 nm, 442 nm, 633 nm and 785 nm.    

    Typical data range: 100 cm-1 - 4000 cm-1 (maximum 30000 cm-1).

    Typical wavelength range:  200 nm to 2200 nm

    Detailed system specification:

    • Extremely high efficiency 250 mm focal length spectrograph (>30% throughput in spectrograph).
    • Laser spot size continuously variable from 1 to 300 um (objective and excitation wavelength dependent) with fully optimised beam path.
    • Automated Rayleigh filter changeover assembly.
    • Automated, kinematically mounted, magnetically attached, Rayleigh line rejection filter set for 325 nm excitation, using paired filters, allowing ripple-free measurement for VIS/NIR PL down to 200 cm-1 from the laser line.
    • Automated, kinematically mounted, magnetically attached, Rayleigh line rejection filter set for 442 nm excitation, using paired filters, allowing ripple-free measurement of the Raman spectrum to 200 cm-1 from the laser line.
    • Rayleigh line rejection filter set for 633 nm excitation, using paired filters, allowing ripple-free measurement of the Raman spectrum to 100 cm-1 from the laser line.
    • Automated, kinematically mounted, magnetically attached, Rayleigh line rejection filter set for 785 nm excitation, using paired filters, allowing ripple-free measurement of the Raman spectrum to 100 cm-1 from the laser line.
    • Visible and UV lens sets motorised and kinematically mounted for optimised spectral resolution.
    • Unique continually adjustable 'easy confocal' facility using motorised slit, with automated signal optimisation.
    • Encoder feedback controlled grating stage with three gratings (2400 lines mm-1 (UV), 1800 lines mm-1 and 1200 lines mm-1) on interchangeable magnetic kinematic mounts.
    • Unique 'extended scanning' facility for measurement of high resolution spectra with wider wavelength range than can be accommodated on a single CCD view, without any 'stitching' of spectra together. Spectral resolution continuously variable via CCD binning control.